The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Sep. 16, 2010
Applicants:

Takashi Yamato, Kakogawa, JP;

Hiroshi Kurono, Kobe, JP;

Inventors:

Takashi Yamato, Kakogawa, JP;

Hiroshi Kurono, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 35/026 (2013.01); G01N 35/00623 (2013.01); G01N 2035/00306 (2013.01); Y10T 436/114165 (2015.01); Y10T 436/25 (2015.01);
Abstract

A sample processing apparatus includes a sample processing unit for obtaining a sample from a sample container and performing a predetermined process of the sample; a transport unit which includes a transport region for transporting, in a transport operation, a sample rack holding the sample container to the sample processing unit, and a rack removal region where the sample rack is accessible to an operator. A restraining member is also provided, which restrains contact by the operator to the sample rack on the transport region. A transport controller controls the transport unit to transport the sample rack on the transport region to the rack removal region after a predetermined transport suspension event occurs during the transport operation.


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