The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Jan. 31, 2014
Applicant:

Dainippon Screen Mfg. Co., Ltd., Kyoto, JP;

Inventors:

Hiroki Fujimoto, Kyoto, JP;

Sanzo Moriwaki, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 33/569 (2006.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
G01N 33/569 (2013.01); G01N 21/5907 (2013.01); G01N 2021/5969 (2013.01);
Abstract

The following processes are performed to improve the accuracy of the process of estimating the volume of a cell clump from an image including the cell clump. First, the image including the cell clump is acquired, and the optical density of the cell clump in the image is measured. Cross-section information about the cell clump is acquired by observation using a confocal microscope or by physical cutting. Based on the cross-section information, the vertical height of the cell clump is determined. Thereafter, data representing a relationship between the aforementioned optical density and the height is acquired. This improves the accuracy of the process of converting the optical density into the height to thereby achieve the accurate estimation of the volume of the cell clump.


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