The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Sep. 19, 2013
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Thomas Flohr, Uehlfeld, DE;

Michael Grasruck, Nuremberg, DE;

Karl Stierstorfer, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/04 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); A61B 6/584 (2013.01); G01T 1/2985 (2013.01); G01N 2223/419 (2013.01); G01N 2223/501 (2013.01);
Abstract

For improved sampling, an x-ray detector system for a computed tomography scanner is provided. In an embodiment, the x-ray detector system includes at least one detector row which includes a plurality of detector modules each having a plurality of detector elements. Along the at least one detector row, a first portion of the detector elements is arranged in a grid at a first grid spacing in relation to its respective neighboring detector elements, and a second portion of the detector elements is arranged in a grid at a second grid spacing in relation to its respective neighboring detector elements.


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