The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Oct. 29, 2008
Koji Fujimoto, Kyoto, JP;
Kotaro Shinozaki, Kyoto, JP;
Shigeru Kitamura, Kyoto, JP;
Arkray Inc, , JP;
Abstract
A method for analyzing a sample includes the step of irradiating a reaction portion of a sample BL and a reagentin a reaction cellA of an analysis unit with light to obtain data Dindicating optical characteristics of this portion. The method further includes the steps of irradiating a reference cellB which is not provided with a reagentwith light in a state in which the sample BL is supplied to the cell to obtain reference data Dindicating optical characteristics of this portion, irradiating a base portionC of the analysis unit with light to obtain reference data Dindicating optical characteristics of this portion, and obtaining data Dindicating optical characteristics of the sample BL before reaction with the reagentbased on the reference data Dand D