The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Sep. 28, 2012
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Ye Yin, Sunyvale, CA (US);

Julia C. Davoud, San Francisco, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/02 (2006.01); G01J 1/42 (2006.01); G01J 3/50 (2006.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0271 (2013.01); G01J 3/506 (2013.01); G09G 3/006 (2013.01); G01J 2001/4247 (2013.01); G09G 2320/029 (2013.01); G09G 2320/0693 (2013.01); G09G 2360/14 (2013.01);
Abstract

A testing device for testing one more characteristics of an electronic display. The testing device includes a main body and a receiving cavity defined within the main body configured to receive at least a portion of the electronic display. The testing device also includes a plurality of sensors positioned on a first surface of the testing device and configured to be in optical communication with at least a portion of the electronic display received within the cavity. The plurality of sensors is configured to detect at least one type of non-uniformity of the electronic display by detecting light emitted from the electronic display.


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