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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9175946 B1

PDFFull Text
Date of Patent:
Nov. 03, 2015

Filed:

Aug. 19, 2011

Measuring method of hole diameter, hole position, hole surface roughness, or bending loss of holey optical fiber, manufacturing method of holey optical fiber, and test method of optical line of holey optical fiber

Applicants:

Itaru Ishida, Sakura, JP;

Shoji Tanigawa, Sakura, JP;

Shoichiro Matsuo, Sakura, JP;

Toshio Kurashima, Tsukuba, JP;

Kazuhide Nakajima, Tsukuba, JP;

Tomoya Shimizu, Tsukuba, JP;

Takashi Matsui, Tsukuba, JP;

Yukihiro Goto, Tsukuba, JP;

Inventors:

Itaru Ishida, Sakura, JP;

Shoji Tanigawa, Sakura, JP;

Shoichiro Matsuo, Sakura, JP;

Toshio Kurashima, Tsukuba, JP;

Kazuhide Nakajima, Tsukuba, JP;

Tomoya Shimizu, Tsukuba, JP;

Takashi Matsui, Tsukuba, JP;

Yukihiro Goto, Tsukuba, JP;

Assignees:

NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Tokyo, JP;

FUJIKURA LTD., Tokyo, JP;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Tarifur Chowdhury

Assistant Examiner:

Sunghee Y Gray

Int. Cl.
CPC ...
G01N 21/00 (2006.01); H04B 17/00 (2015.01); G01B 11/08 (2006.01); G01N 21/958 (2006.01); G01N 21/954 (2006.01); G01B 11/24 (2006.01); G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
G01B 11/08 (2013.01); G01B 11/24 (2013.01); G01B 11/30 (2013.01); G01B 11/303 (2013.01); G01B 11/306 (2013.01); G01N 21/954 (2013.01); G01N 21/958 (2013.01);
Abstract

A measuring method of a hole diameter of a holey optical fiber includes calculating an arithmetical mean value I(x) from two backscattering light intensities at a position x of two backscattering light waveforms of the holey optical fiber, in which the two backscattering light waveforms are obtained by OTDR measurement; and obtaining the hole diameter at the position x, based on a correlation between an arithmetical mean value I(x) and an hole diameter of the holey optical fiber that is obtained in advance.

Find Patent Forward Citations

Ishida, Itaru. (2015). Measuring method of hole diameter, hole position, hole surface roughness, or bending loss of holey optical fiber, manufacturing method of holey optical fiber, and test method of optical line of holey optical fiber (U.S. Patent No. 9175946). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9175946

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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