The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Oct. 02, 2009
Applicants:

Najmud Dowla, Katy, TX (US);

John C. Rasmus, Richmond, TX (US);

Abhijeet Nayan, Bihar, IN;

Taesoo Kim, East Perth, AU;

Richard J. Radtke, Pearland, TX (US);

Michael Evans, Missouri City, TX (US);

Inventors:

Najmud Dowla, Katy, TX (US);

John C. Rasmus, Richmond, TX (US);

Abhijeet Nayan, Bihar, IN;

Taesoo Kim, East Perth, AU;

Richard J. Radtke, Pearland, TX (US);

Michael Evans, Missouri City, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 47/09 (2012.01); E21B 17/08 (2006.01);
U.S. Cl.
CPC ...
E21B 47/09 (2013.01); E21B 17/08 (2013.01);
Abstract

Systems and methods identify and/or detect one or more features of a well casing by utilizing one or more downhole measurements obtainable by a downhole component. The one or more features of the well casing are identifiable and/or detectable from the one or more measurements associated with one or more properties of the one or more features of the well casing. The one or more measurements for indentifying and/or detecting a presence and/or a location of the one or more features of the well casing include sonic measurements, nuclear measurements, gamma ray measurements, photoelectric measurements, resistivity measurements and/or combinations thereof.


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