The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

May. 16, 2012
Applicants:

Shinichiro Ochiai, Nagoya, JP;

Sadayuki Kobayashi, Nagoya, JP;

Inventors:

Shinichiro Ochiai, Nagoya, JP;

Sadayuki Kobayashi, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08J 3/20 (2006.01); C08J 5/00 (2006.01); C08L 77/00 (2006.01); C08L 101/00 (2006.01); C08L 77/02 (2006.01); C08J 3/00 (2006.01); C08L 23/12 (2006.01); C08L 67/03 (2006.01); B29C 47/00 (2006.01); B29C 47/60 (2006.01); B29C 47/92 (2006.01); B29C 47/10 (2006.01); B29B 7/72 (2006.01); B29C 47/64 (2006.01); B29B 7/48 (2006.01); B29B 7/82 (2006.01); B29B 7/90 (2006.01);
U.S. Cl.
CPC ...
C08L 77/02 (2013.01); B29C 47/0007 (2013.01); B29C 47/0011 (2013.01); B29C 47/0066 (2013.01); B29C 47/1009 (2013.01); B29C 47/6087 (2013.01); B29C 47/92 (2013.01); C08J 3/005 (2013.01); C08L 23/12 (2013.01); C08L 67/03 (2013.01); B29B 7/482 (2013.01); B29B 7/726 (2013.01); B29B 7/82 (2013.01); B29B 7/90 (2013.01); B29C 47/64 (2013.01); B29C 2947/92704 (2013.01); B29C 2947/92895 (2013.01); C08L 2205/02 (2013.01);
Abstract

A process of producing a polymer alloy includes melt-kneading at least two incompatible crystalline resins in a supercooled state by chaotic mixing using a twin-screw extruder. A polymer alloy obtained by melt-kneading at least two incompatible crystalline resins has a dispersed structure that particles dispersed in the polymer alloy have an average particle size of 0.001 to 1 μm, wherein in scattering measurement, (a) a peak half-width in a spectrum obtained by plotting scattering intensity against the wavenumber of scattered light and (b) a maximum wavenumber of the peak satisfy: 0<(a)/(b)≦1.5.


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