The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Oct. 24, 2012
Applicant:

Eisuke Minehara, Ibaraki, JP;

Inventor:

Eisuke Minehara, Ibaraki, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/36 (2014.01); G21F 9/28 (2006.01); B23K 26/00 (2014.01); G21F 9/00 (2006.01); G21F 9/30 (2006.01); B23K 26/08 (2014.01); B23K 26/14 (2014.01);
U.S. Cl.
CPC ...
B23K 26/0066 (2013.01); B23K 26/0807 (2013.01); B23K 26/1405 (2013.01); B23K 26/36 (2013.01); G21F 9/005 (2013.01); G21F 9/28 (2013.01); G21F 9/30 (2013.01);
Abstract

The laser decontamination device includes: a laser oscillator; a scanning device provided with an XY axis scanner and a Z axis scanner to condense the laser beam emitted from the laser oscillator onto the surface of the contaminated article without the intervention of any compound lens such as an f θ lens so as to optically scan the surface; and a surface shape measuring device to measure the surface shape of the contaminated article, the Z axis scanner being provided with a focus position controlling section to automatically adjust a focus position in accordance with an irradiation position such that a focus of the laser beam comes on the surface of the contaminated article based on a shape data obtained at the surface shape measuring device.


Find Patent Forward Citations

Loading…