The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Jul. 08, 2013
Jack Clark, Fresno, CA (US);
Jack Clark, Fresno, CA (US);
Other;
Abstract
Aspects are disclosed for determining refractive error. In an aspect, a line pattern is displayed to a user, and a distance between the line pattern and the user is ascertained. The line pattern includes a first and second line in which an aspect of the line pattern is varied, and where refractive error is quantified based on the distance and a selected variance of the line pattern. In another aspect, the varied aspect of the line is at least one of a width between the first and second line, a thickness of the first or second line, a darkness of the first line or the second line, or a color of the first line or the second line. An input corresponding to a focused line pattern variance selected by the user is then received, and a refractive error is quantified based on the input and an approximate distance between the line pattern and the user.