The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Dec. 22, 2011
Kenji Nakamura, Toyohashi, JP;
Mitsuhiro Gono, Toyokawa, JP;
Kenji Nakamura, Toyohashi, JP;
Mitsuhiro Gono, Toyokawa, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
An eye measurement apparatus includes: a subjective measurement optical system configured to subjectively measure an examinee's eye, the subjective measurement optical system including: a chart to be presented to the examinee's eye; and a glare light source for irradiating the examinee's eye with a glare light; and a control part configured to determine presence or absence of opacity in a light transmitting part of the examinee's eye and, when the presence of opacity is determined, to allow display of necessity for a glare test which is a subjective measurement to be performed in a state that the examinee's eye is irradiated with the glare light.