The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Dec. 12, 2011
Eddy C. Tam, Mint Hill, NC (US);
John G. Larkin, Charlotte, NC (US);
Brian J. Mock, Raleigh, NC (US);
Eddy C. Tam, Mint Hill, NC (US);
John G. Larkin, Charlotte, NC (US);
Brian J. Mock, Raleigh, NC (US);
Event Capture Systems, Inc., Charlotte, NC (US);
Abstract
A method for identifying defects in a web of material is provided. The method may include monitoring one or more characteristics of a web translating along a travel path. The one or more characteristics may include one of position, speed of travel, and direction of travel. The method may include identifying a candidate for a defect by detecting one or more deviations in the web at a first time frame. The method may include monitoring one or more characteristics of the candidate for a defect at one or more subsequent time frames. The method may include determining whether the candidate is a defect by comparing the one or more characteristics of the candidate at one or more subsequent time frames to the one or more characteristics of the web. A related system is also provided.