The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Mar. 08, 2013
Keiji Kojima, Kanagawa, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Tadashi Kitai, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
Keiichi Miyamoto, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Tadashi Kitai, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
Keiichi Miyamoto, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An apparatus, system, method, and non-transitory recording medium storing an image inspection control program, each of which is capable of inspecting a printed image are provided. While generating an inspection image to be used for inspecting a read image obtained by reading the printed image, attribute data indicating, for each pixel in the inspection image, whether the pixel belongs to drawing data in the inspection image is generated. The attribute data is used to process inspection of the read image based on comparison between the read image and the inspection image.