The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9171963 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 27, 2015

Filed:

Mar. 29, 2012
Applicants:

Qiang Cui, Orlando, FL (US);

Juin Jei Liou, Oviedo, FL (US);

Inventors:

Qiang Cui, Orlando, FL (US);

Juin Jei Liou, Oviedo, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/812 (2006.01); H01L 27/02 (2006.01); H01L 29/778 (2006.01);
U.S. Cl.
CPC ...
H01L 29/812 (2013.01); H01L 27/0248 (2013.01); H01L 29/7787 (2013.01); H01L 29/8128 (2013.01); H01L 2924/0002 (2013.01);
Abstract

An integrated electrostatic discharge (ESD) shunting circuit includes a III-V semiconductor layer, and a first drain-less high electron mobility transistor (HEMT) or a metal-semiconductor FET (MESFET) transistor having a first gate and at least a second drain-less HEMT or MESFET having a second gate formed in the substrate. The HEMTs or MESFETs include a donor layer on the semiconductor layer, no drains, and a source including an ohmic contact layer on the donor layer.


Find Patent Forward Citations

Cui, Qiang. (2015). Electrostatic discharge shunting circuit (U.S. Patent No. 9171963). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9171963

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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