The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Jul. 16, 2014
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;

Inventor:

Toshitaka Miyata, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/423 (2006.01); H01L 29/43 (2006.01); H01L 29/78 (2006.01); H01L 21/8232 (2006.01); H01L 21/28 (2006.01); H01L 29/66 (2006.01); H01L 29/51 (2006.01); H01L 21/311 (2006.01); H01L 29/49 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7831 (2013.01); H01L 21/28035 (2013.01); H01L 21/28158 (2013.01); H01L 21/31111 (2013.01); H01L 29/42364 (2013.01); H01L 29/4916 (2013.01); H01L 29/517 (2013.01); H01L 29/66484 (2013.01);
Abstract

According to one embodiment, a semiconductor device includes a drain region, a source region, a channel region, a first gate insulator film provided on the channel region, a second gate insulator film provided on the channel region to be adjacent to the first gate insulator film on the source region side of the first gate insulator film, a first gate electrode provided on the first gate insulator film, and a second gate electrode provided on the second gate insulator film. An electrical thickness of the second gate insulator film is less than an electrical thickness of the first gate insulator film. A portion of the first gate electrode is provided on the second gate insulator film. A work function of the second gate electrode is higher than a work function of the first gate electrode.


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