The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Dec. 17, 2014
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Display Technology Co., Ltd., Beijing, CN;

Inventors:

Yujie Gao, Beijing, CN;

Sangjin Park, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/58 (2006.01); H01L 27/12 (2006.01); G02F 1/1368 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 27/124 (2013.01); G02F 1/1368 (2013.01); H01L 22/32 (2013.01); H01L 22/34 (2013.01);
Abstract

The present invention provides an array substrate and a display device, to solve the problem of low testing precision due to significant difference between characteristics of TFTs in the detecting region and TFTs in the display region in the prior art. The array substrate comprises a display region and a dummy pixel region provided in the periphery of the display region, wherein, at least one detecting unit is provided in the dummy pixel region, each detecting unit comprises one second pixel unit, one thin film transistor is provided correspondingly to each second pixel unit, and respective electrodes of each thin film transistor provided correspondingly to the second pixel unit are connected to an external test device through test lines, respectively.


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