The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Apr. 05, 2013
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Yasunobu Tokuda, Okaya, JP;
Assignee:
SEIKO EPSON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); G11C 16/34 (2006.01); G11C 29/12 (2006.01); G11C 29/48 (2006.01); G11C 16/04 (2006.01); G11C 29/24 (2006.01);
U.S. Cl.
CPC ...
G11C 16/349 (2013.01); G11C 29/1201 (2013.01); G11C 29/48 (2013.01); G11C 16/0433 (2013.01); G11C 29/24 (2013.01);
Abstract
A latch circuit that latches stored data of a nonvolatile storage device used for setting the function of a semiconductor device and adjusting the characteristics of the semiconductor device required a dedicated input-output circuit for a test of the semiconductor device. By providing a dummy storage device, it becomes possible to perform a test of the semiconductor device without providing a dedicated input-output circuit.