The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Aug. 13, 2012
Applicants:

Jorg Frankenberger, Markt Schwaben, DE;

Michael Bloss, Munich, DE;

Erich Kerst, Unterfohring, DE;

Inventors:

Jorg Frankenberger, Markt Schwaben, DE;

Michael Bloss, Munich, DE;

Erich Kerst, Unterfohring, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07F 7/04 (2006.01); G06K 7/00 (2006.01); G06K 9/00 (2006.01); G07D 7/00 (2006.01); G07D 7/12 (2006.01); G07D 7/20 (2006.01); G07D 11/00 (2006.01);
U.S. Cl.
CPC ...
G07D 7/128 (2013.01); G07D 7/0006 (2013.01); G07D 7/006 (2013.01); G07D 7/0046 (2013.01); G07D 7/121 (2013.01); G07D 7/122 (2013.01); G07D 7/205 (2013.01); G07D 7/2075 (2013.01); G07D 11/0048 (2013.01);
Abstract

A sensor for checking different features of value documents is arranged to carry out a self-test for testing its functionality. Before the sensor carries out its self-test, at least one of the features that is to be checked by the sensor is selected. It is provided in the self-test that the sensor rates a malfunction ascertained in the self-test differently and reacts to the ascertained malfunction differently in dependence on the selected feature. While a malfunction of the sensor has hitherto always led to a failure of the sensor, the sensor, despite ascertained malfunctions, can nevertheless carry out the check of certain features. It is achieved that the number of function failures of the sensor is reduced through the different reactions of the sensor to the ascertained malfunction in dependence on the feature.


Find Patent Forward Citations

Loading…