The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Jun. 20, 2013
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Yong Min Tai, Gunpo-si, KR;
Young Su Moon, Seoul, KR;
Jung Uk Cho, Hwaseong-si, KR;
Joon Hyuk Cha, Incheon, KR;
Hyun Sang Park, Cheonan-si, KR;
Shi Hwa Lee, Seoul, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-Si, KR;
Abstract
Provided is an apparatus and method for extracting feature information of an image using a scale-invariant feature transform (SIFT) algorithm. The apparatus may include a first interface configured to generate one or more tile images from a first source image stored in a particular memory, such as a high-capacity short-term memory, and a feature information extractor configured to receive the generated one or more tile images and to respectively extract feature information from each of the one or more input tile images, where the first interface may be configured to generate the one or more tile images by selectively dividing the first source image into the one or more tile images based on a horizontal resolution of the first source image.