The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Mar. 08, 2013
Kabushiki Kaisha Topcon, Itabashi-ku, Tokyo, JP;
Nobuyuki Fukaya, Tokyo, JP;
Tetsuji Anai, Tokyo, JP;
Nobuo Kochi, Tokyo, JP;
Hitoshi Otani, Tokyo, JP;
KABUSHIKI KAISHA TOPCON, Tokyo, JP;
Abstract
Three-dimensional coordinates of feature points of an object to be measured are back-projected to a frame image photographed from a specific position, and image coordinates of the back-projected feature points and the feature points in this frame image are compared. In this case, the feature points, which are mismatched, are removed as feature points which are mistracked between plural frames. In this case, two processing systems, of which initial conditions of calculation for obtaining the back-projected coordinates are different from each other, are performed, and the detection of the above mistracked points is performed on each of the two back-projected coordinates. The mistracked points detected in at least one of the processing systems are removed, and are not succeeded to the following processing.