The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Mar. 15, 2013
Yahoo! Inc., Sunnyvale, CA (US);
Alyssa Glass, Sunnyvale, CA (US);
Xing Yi, Milpitas, CA (US);
Jean-Marc Langlois, Menlo Park, CA (US);
YAHOO! INC., Sunnyvale, CA (US);
Abstract
Method, system, and programs for identifying a target metric. In one example, at least one first type of metric computed based on a first period associated with a first length of time is measured for each of a plurality of users. At least one second type of metric computed based on a second period associated with a second length of time is measured for each of the plurality of users. The second length of time is larger than the first length of time. Correlations between each of the at least one first type of metric and each of the at least one second type of metrics are computed with respect to the plurality of users. A target metric is identified from the at least one first type of metric based on the correlations. The target metric is correlated with the at least one second type of metric.