The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Nov. 07, 2011
Applicants:

Aydogan Ozcan, Boston, MA (US);

Michel J. F. Digonnet, Palo Alto, CA (US);

Gordon S. Kino, Stanford, CA (US);

Inventors:

Aydogan Ozcan, Boston, MA (US);

Michel J. F. Digonnet, Palo Alto, CA (US);

Gordon S. Kino, Stanford, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 11/00 (2006.01); G01J 3/45 (2006.01); G06E 3/00 (2006.01);
U.S. Cl.
CPC ...
G06E 3/003 (2013.01); G01J 11/00 (2013.01); G01J 3/45 (2013.01);
Abstract

A method utilizes an optical image processing system. The method includes calculating a product of (i) a measured magnitude of a Fourier transform of a complex transmission function of an object or optical image and (ii) an estimated phase term of the Fourier transform of the complex transmission function. The method further includes calculating an inverse Fourier transform of the product, wherein the inverse Fourier transform is a spatial function. The method further includes calculating an estimated complex transmission function by applying at least one constraint to the inverse Fourier transform.


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