The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Dec. 07, 2012
Canon Kabushiki Kaisha, Tokyo, JP;
Junya Arakawa, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An inspection apparatus inspects a printed product by positioning a reading target image of the printed product relative to a reference image and collating the reading target image with the reference image includes a positioning unit configured to perform positioning processing for the reference image and the reading target image with a first precision, and a detection unit configured to detect an image defect candidate area by collating the reading target image with the reference image, which have been positioned by the positioning unit. The positioning unit newly performs the positioning processing for the reference image and the reading target image in the image defect candidate area with a second precision that is higher than the first precision. The detection unit detects an image defect by collating the reading target image with the reference image in an area having been newly subjected to the positioning processing using the second precision.