The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Apr. 16, 2012
Christopher A. Dirubio, Webster, NY (US);
Charles H. Tabb, Penfield, NY (US);
Michael A. Fayette, Penfield, NY (US);
John S. Facci, Webster, NY (US);
Paul F. Sawicki, Rochester, NY (US);
Thomas C. Keyes, Fairport, NY (US);
Edward W. Schnepf, Ontario, NY (US);
William R. Klimley, Webster, NY (US);
Christopher A. DiRubio, Webster, NY (US);
Charles H. Tabb, Penfield, NY (US);
Michael A. Fayette, Penfield, NY (US);
John S. Facci, Webster, NY (US);
Paul F. Sawicki, Rochester, NY (US);
Thomas C. Keyes, Fairport, NY (US);
Edward W. Schnepf, Ontario, NY (US);
William R. Klimley, Webster, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
Disclosed is a closed-loop control method and system to control the nip width and transfer field uniformity associated with an image marking apparatus. According to an exemplary embodiment, a closed-loop control system senses the uniformity of the image transfer field and applies forces to a transfer nip based on the sensed field to provide a more uniform field.