The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Nov. 27, 2013
Jeffrey Porter, Gilbert, AZ (US);
Cheryl Watkins, Gilbert, AZ (US);
Jeffrey Porter, Gilbert, AZ (US);
Cheryl Watkins, Gilbert, AZ (US);
Yancy Corp., Peoria, AZ (US);
Abstract
A wide-field optical microscope and method capable of resolving images down to 0.1 {acute over (Å)} with a magnification range in excess of 250 million power includes an objective having a primary and a secondary element. A sample is held so that the area of interest is at a location that is closer to the primary element than the focal length of the primary element. The primary element collects and collimates light reflected from the sample. The secondary element then focuses the collimated light onto a pinhole aperture, which blocks all light rays that were not parallel, thus producing a non-focused reflected pattern. The non-focused reflected pattern passes through a field stop and is then magnified by one or more negative optical elements and additional field stops to produce an enlarged pattern.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile