The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Aug. 26, 2011
Applicant:
Frank Schreiber, Dossenheim, DE;
Inventor:
Frank Schreiber, Dossenheim, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01); G02B 21/16 (2006.01); G01N 21/64 (2006.01); H01S 3/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/16 (2013.01); G01N 21/6408 (2013.01); G01N 21/6458 (2013.01); G02B 2207/117 (2013.01); H01S 3/0057 (2013.01);
Abstract
A laser microscope () having a laser light source () which generates laser light pulses () for the purpose of examining a sample (). An optical element () is arranged in the beam path of the laser light pulses (). The optical element () disperses the wavelength spectrum of the laser light pulses (). Fractions () of the broad-band laser light pulses () having different wavelengths travel different path lengths upon passing through a compensation device (), such that the different fractions () arrive at the sample () at the same time.