The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Mar. 01, 2012
Applicants:

Edwin Maria Wolterink, Valkenswaard, NL;

Yelena Vladimirovna Shulepova, Eindhoven, NL;

Koen Gerard Demeyer, Genk, BE;

Inventors:

Edwin Maria Wolterink, Valkenswaard, NL;

Yelena Vladimirovna Shulepova, Eindhoven, NL;

Koen Gerard Demeyer, Genk, BE;

Assignee:

ANTERYON INTERNATIONAL B.V., CA Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 9/00 (2006.01); G02B 13/00 (2006.01);
U.S. Cl.
CPC ...
G02B 13/001 (2013.01); G02B 13/003 (2013.01); G02B 13/006 (2013.01); G02B 13/0085 (2013.01);
Abstract

The present invention relates to optical unit comprising, seen in the direction from the object side to the imaging surface, a first substrate, a first lens, a second lens and a second substrate, characterized in that the distance [(vertex first lens) and (vertex second lens)] is 250-650 pm. Such an optical unit is used, inter alia, in image processing units, such as cameras. It is an object of the present invention to provide an optical unit in which the desired dimensional precision of the lens system can be accomplished without this leading to an undesirable increase of the optical unit's dimensions.


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