The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Dec. 13, 2012
Applicant:

Kabushiki Kaisha Toshiba, Minato-Ku, JP;

Inventors:

Yoshinori Satoh, Yokohama, JP;

Toru Onodera, Yokohama, JP;

Naoto Kume, Yokohama, JP;

Shunichiro Makino, Yokosuka, JP;

Tetsuro Aikawa, Shinagawa-Ku, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/17 (2006.01); G01T 1/29 (2006.01); G01T 1/16 (2006.01); G01T 7/00 (2006.01); G06T 11/60 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2914 (2013.01); G01T 1/16 (2013.01); G01T 7/00 (2013.01); G06T 11/60 (2013.01);
Abstract

A radiation measurement apparatusincludes a visible image acquisition unitthat takes a visible image, a radiation intensity acquisition unitthat measures intensity distribution of radiation incoming from a direction being substantially equal to an image picking up direction of the visible image acquisition unit, and an intensity display unitA that displays an image acquired by overlaying the intensity distribution of radiation, which is represented by using a plurality of colors being allocated to the intensity distribution of radiation on the visible image.


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