The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Jan. 28, 2013
Applicant:

L-3 Communications Corp., New York, NY (US);

Inventors:

Scott M. Lyon, South Weber, UT (US);

Merle L. Keller, Salt Lake City, UT (US);

Assignee:

L-3 Communications Corp., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 3/02 (2006.01);
U.S. Cl.
CPC ...
G01S 3/023 (2013.01);
Abstract

Processes for determining imperfection offsets between an antenna and the platform to which the antenna is coupled, where the imperfection offsets are unknown offsets due to imperfections such as manufacturing imperfections. The platform can include an orientation mechanism that provides the orientation of the platform, and the imperfection offsets can be between the antenna and the orientation mechanism. The processes can include determining two different relative pointing vectors that correspond to a detected peak strength of a test signal transmitted between one or more targets and the antenna. The processes can further include utilizing an optimization process to determine the heading, pitch, and roll of the imperfection offsets from the two different relative pointing vectors.


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