The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Jan. 27, 2012
Applicants:

Peder Larson, Redwood City, CA (US);

Adam B. Kerr, Menlo Park, CA (US);

John M. Pauly, Stanford, CA (US);

Daniel B. Vigneron, Corte Madera, CA (US);

Inventors:

Peder Larson, Redwood City, CA (US);

Adam B. Kerr, Menlo Park, CA (US);

John M. Pauly, Stanford, CA (US);

Daniel B. Vigneron, Corte Madera, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/46 (2006.01); G01R 33/563 (2006.01); G01R 33/485 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4608 (2013.01); G01R 33/4616 (2013.01); G01R 33/485 (2013.01); G01R 33/5601 (2013.01); G01R 33/5605 (2013.01); G01R 33/56333 (2013.01);
Abstract

A method for imaging a substrate and product over time is provided. The substrate and product are magnetically tagged with at least one magnetic gradient where magnetically tagging provides a tag-dependent signal phase for the substrate and a different tag-dependent signal phase for the product. At least one readout of magnetically tagged substrate and product is provided over time. The tag-dependent signal phase is used to determine product that has been transformed from magnetically tagged substrate and substrate that has been transformed from magnetically tagged product over time.


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