The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Aug. 23, 2013
Jeffrey Clark, Alhambra, CA (US);
Jeffrey Clark, Alhambra, CA (US);
AUDYSSEY LABORATORIES, INC., Los Angeles, CA (US);
Abstract
A method for measuring acoustic impulse response of a Device Under Test (DUT) addresses sample rate variations by determining clock rate differences between the DUT and test system, and making adjustments to compensate for the different clock rates. An interrogation signal is generated with two 'events' spaced a known number of samples apart, at the nominal sampling rate of the DUT. The interrogation signal is played through the DUT and recorded by a measurement system. The number of samples between the two 'events' is measured in the sampled signal to determine the shift introduced by the different clock rates. The adjustment is then applied to either the original frequency response measurement signal by adjusting the sampling rate of a frequency response measurement signal to compensate for the different clock rates, or to the measured signal before averaging, to align the samples and prevent cancelling.