The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Nov. 14, 2013
Hitachi, Ltd., Tokyo, JP;
Akira Nishimizu, Tokyo, JP;
Atsushi Ishihara, Tokyo, JP;
Jun Matsumoto, Tokyo, JP;
Takayuki Kawanaka, Tokyo, JP;
Hitachi, Ltd., Kanagawa, JP;
Abstract
An eddy current testing apparatus includes: an eddy current testing probe having an eddy current testing coil arranged on a bottom portion of a casing; a pressing mechanism configured to press the eddy current testing probe so that the bottom portion of the eddy current testing probe is placed in contact with a part of an inner wall surface of a slot formed in an object to be inspected; a carriage configured to mount the pressing mechanism and the eddy current testing probe, the carriage traveling in a depth direction of the slot; and an eddy current testing control device configured to control defect detection for the inner wall surface of the slot by acquiring a detected eddy current signal from the eddy current testing coil.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile