The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Jan. 13, 2012
Applicants:

Martin Hirning, Heidelberg, DE;

Michael Kohlmann, Frankenthal, DE;

Inventors:

Martin Hirning, Heidelberg, DE;

Michael Kohlmann, Frankenthal, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/32 (2006.01); G01N 21/55 (2014.01); G01J 3/46 (2006.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G01N 33/32 (2013.01); G01J 3/46 (2013.01); G01N 21/35 (2013.01);
Abstract

A method, apparatus and print process control strip determine a curing level of printing inks on printing material. Conventional measuring areas of a print process control strip are always formed by tonal value combinations of individual, reliably thoroughly dried, printing inks, in particular when using intermediate dryers. Measuring the measuring areas furnishes no more accurate information with regard to the curing level of ink combinations in the actual printed image which differ from the combinations of the measuring areas of the print process control strip. A level-of-curing control area is provided, which is formed by overprinting preferably at least four printing inks, in each case in full tone, to obtain statements relating to the curing level of the printing inks with the print process control strip. Measuring the level-of-curing control area provides information about the curing level of all printing ink combinations in the printed image.


Find Patent Forward Citations

Loading…