The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Feb. 28, 2013
Applicant:

Seiko Instruments Inc., Chiba, JP;

Inventors:

Takeshi Uchiyama, Chiba, JP;

Masataka Shinogi, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 9/16 (2006.01); G01L 13/02 (2006.01); G01L 19/00 (2006.01); G01L 9/00 (2006.01);
U.S. Cl.
CPC ...
G01L 13/02 (2013.01); G01L 9/0019 (2013.01); G01L 9/0055 (2013.01); G01L 19/0038 (2013.01);
Abstract

A pressure sensor has a detecting unit configured to detect a difference between outputs from deformation detecting units of first and second pressure variation sensors. The first and second pressure variation sensors are connected to one another so that the gap of the first pressure variation sensor communicates the exterior of the cavities of the first and second pressure variation sensors and the interior of the cavity of the first pressure variation sensor, and so that the gap of the second pressure variation sensor communicates the interior of the cavity of the first pressure variation sensor and the interior of the cavity of the second pressure variation sensor.


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