The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Jun. 26, 2007
Michael L. Myrick, Irmo, SC (US);
Ryan J. Priore, Columbia, SC (US);
Robert P. Freese, Pittsboro, NC (US);
John C. Blackburn, Charleston, SC (US);
Michael L. Myrick, Irmo, SC (US);
Ryan J. Priore, Columbia, SC (US);
Robert P. Freese, Pittsboro, NC (US);
John C. Blackburn, Charleston, SC (US);
HALLIBURTON ENERGY SERVICES, INC., Houston, TX (US);
Abstract
A method of classifying information in an optical analysis system includes obtaining calibration data defining a plurality of data points, each data point representing values for two or more detectors when sampling a material used to construct a multivariate optical element. Based on the calibration data, one or more validation models can be developed to indicate one or more ranges of expected results. Validation data comprising the models can be used to compare data points representing values for two or more detectors when performing a measurement of a material to determine if the data points fall within an expected range. Classification data can be generated based on the comparison and, in some embodiments, one or more indicators, such as a confidence level in a measurement, can be provided.