The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Jul. 09, 2012
Applicants:

Yu Gong, Orlando, FL (US);

Ryan Kruse, Waltham, MA (US);

Inventors:

Yu Gong, Orlando, FL (US);

Ryan Kruse, Waltham, MA (US);

Assignee:

FARO TECHNOLOGIES, INC., Lake Mary, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G01B 11/24 (2006.01); G01B 11/25 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2527 (2013.01); G01B 11/002 (2013.01); G01B 11/24 (2013.01);
Abstract

A method for determining three-dimensional coordinates of an object point on a surface of an object, the method including steps of: providing a source, a projector, and a camera; in each of two instances: spatially modulating source light; sending a modulator pattern of light through the projector lens to form light spots; filtering the spots with a pinhole plate; propagating light from the light spots onto the object to produce a fringe pattern; imaging the object point with a camera lens onto an array point of the photosensitive array to obtain first and second electrical data values from the photosensitive array; and determining the three-dimensional coordinates of the first object point based at least in part on the first electrical data value, the second electrical data value, and a baseline length.


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