The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Jun. 08, 2012
Applicants:
Shyam P. Keshavmurthy, Ann Arbor, MI (US);
Chengchih Lin, Ann Arbor, MI (US);
David T. Wegryn, Ann Arbor, MI (US);
Inventors:
Shyam P. Keshavmurthy, Ann Arbor, MI (US);
Chengchih Lin, Ann Arbor, MI (US);
David T. Wegryn, Ann Arbor, MI (US);
Assignee:
Perceptron, Inc., Plymouth, MI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/25 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2509 (2013.01); G01B 11/2441 (2013.01); G01B 11/2513 (2013.01); G01B 11/2518 (2013.01);
Abstract
A system and method is provided for imaging an article within a field of view, projecting an illumination field onto the article within field of view, and selectively projecting illumination structures onto the article within the field of view. Then, image data corresponding to the illumination field and the illumination structures may be received and a feature of the article may be analyzed based on the illumination field and the illumination structures.