The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Mar. 26, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tomoyuki Makihira, Tokyo, JP;

Kazuhide Miyata, Yokohama, JP;

Makoto Sato, Tokyo, JP;

Yoshihiko Iwase, Kyoto, JP;

Kazuro Yamada, Kawasaki, JP;

Ritsuya Tomita, Kawasaki, JP;

Yohei Minatoya, Yokohama, JP;

Daisuke Kibe, Chigasaki, JP;

Hiroyuki Shinbata, Tama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02015 (2013.01);
Abstract

An optical coherence tomography imaging apparatus that acquires a tomographic image from interference light between a reference beam and a measuring beam obtained via an object includes a control unit configured to control a difference in optical path length between the reference beam and the measuring beam by a control method according to an imaging target region, and a signal processing unit configured to generate image data of the object based on an electrical signal obtained by detecting the interference light with the difference in optical path length controlled by the control method.


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