The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

May. 02, 2012
Applicants:

Alexander Diebold, Rastatt, DE;

Ulrich Hofmann, Oetigheim, DE;

Erik Lang, Ettlingen, DE;

Josef Lelle, Baden-Baden, DE;

Inventors:

Alexander Diebold, Rastatt, DE;

Ulrich Hofmann, Oetigheim, DE;

Erik Lang, Ettlingen, DE;

Josef Lelle, Baden-Baden, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F23N 5/24 (2006.01); F23N 5/08 (2006.01);
U.S. Cl.
CPC ...
F23N 5/082 (2013.01); F23N 5/242 (2013.01); F23N 5/08 (2013.01); F23N 2029/00 (2013.01); F23N 2029/02 (2013.01); F23N 2029/04 (2013.01); F23N 2029/14 (2013.01); F23N 2029/16 (2013.01);
Abstract

A monitoring device has a first flame detector, to receive a first batch of radiation, which is emitted by the first flame, a second flame detector, to receive a second batch of radiation, which is emitted by the second flame, a voltage supplying device to apply an alternating voltage with a first half wave and a second half wave to the two flame detectors and an evaluation circuit that is connected to the two flame detectors via a signal input. A first measurement signal that is present at the common signal input during the first half wave is indicative of the intensity of the first batch of radiation. A second measurement signal that is present at the common signal input during the second half wave is indicative of the intensity of the second batch of radiation. The evaluation circuit independently evaluates the first measurement signal and the second measurement signal.


Find Patent Forward Citations

Loading…