The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
May. 18, 2012
Peter D. Ludowise, Cottage Grove, MN (US);
David A. Whitman, St. Paul, MN (US);
Kyle C. Armantrout, Los Angeles, CA (US);
Maurice Exner, San Clemente, CA (US);
Lucien A. E. Jacky, Orange, CA (US);
Michelle Tabb, Santa Ana, CA (US);
Peter D. Ludowise, Cottage Grove, MN (US);
David A. Whitman, St. Paul, MN (US);
Kyle C. Armantrout, Los Angeles, CA (US);
Maurice Exner, San Clemente, CA (US);
Lucien A. E. Jacky, Orange, CA (US);
Michelle Tabb, Santa Ana, CA (US);
3M Innovative Properties Company, St. Paul, MN (US);
Focus Diagnostics, Inc., Cypress, CA (US);
Abstract
Systems and methods for processing sample processing devices. The system can include a sample processing device comprising a detection chamber, a motor configured to rotate the sample processing device about an axis of rotation, and an optical module operatively positioned relative to the sample processing device and configured to determine whether a selected volume of material is present in the detection chamber of the sample processing device. The method can include rotating the sample processing device about an axis of rotation, and determining whether a selected volume of material is present in the detection chamber, while rotating the sample processing device. In some embodiments, determining whether a selected volume of material is present can be performed by optically interrogating the detection chamber for an optical property of the material.