The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Jun. 13, 2013
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Tomoaki Nakamura, Nagano, JP;

Hiroaki Hosomi, Minowa-machi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); B06B 1/06 (2006.01);
U.S. Cl.
CPC ...
A61B 8/4444 (2013.01); B06B 1/0629 (2013.01); B06B 1/0674 (2013.01);
Abstract

An ultrasonic probe includes a substrate, a diaphragm, a thin-film piezoelectric element, a communication passage, and an air hole. The substrate has first and second cavities thereon. The diaphragm is configured at the first cavity. The thin-film piezoelectric element is configured to the diaphragms. The communicating passage is configured in the substrate and extending from the first cavity to the second cavity. The air hole extends between the communicating passage to an outside of the substrate.


Find Patent Forward Citations

Nakamura, Tomoaki. (2015). Ultrasonic probe and ultrasonic inspection apparatus (U.S. Patent No. 9168025). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9168025

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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