The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2015

Filed:

Nov. 03, 2010
Applicants:

Steven N. Roe, San Mateo, CA (US);

Michael Keil, Ludwigshafen, DE;

Charles C. Raney, Camdenton, MO (US);

Inventors:

Steven N. Roe, San Mateo, CA (US);

Michael Keil, Ludwigshafen, DE;

Charles C. Raney, Camdenton, MO (US);

Assignee:

Roche Diabetes Care, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 17/14 (2006.01); A61B 17/32 (2006.01); A61B 5/15 (2006.01); A61B 5/151 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1411 (2013.01); A61B 5/15019 (2013.01); A61B 5/150022 (2013.01); A61B 5/15113 (2013.01); A61B 5/15117 (2013.01); A61B 5/15128 (2013.01); A61B 5/15186 (2013.01); A61B 5/150412 (2013.01); A61B 5/1513 (2013.01); A61B 5/1519 (2013.01); A61B 5/15115 (2013.01); A61B 5/15126 (2013.01); A61B 5/15194 (2013.01); A61B 5/150198 (2013.01);
Abstract

Adjustment mechanisms are used in conjunction with integrated lancet test strips to adjust the position of the drive system, engagement system, or the drive coupling in a fixed stroke lancing system to thereby adjust the penetration depth of the lancet. In a variable drive stroke lancing system, the lancet penetration depth is adjusted by changing the stroke length of a drive system. The stroke length of a drive system is adjusted by rotating a cam or sliding a cam in a cam type drive system. In either the fixed or the variable drive stroke lancing system, the test strip and/or guidance foil of the integrated lancet test strip is immobilized while the lancet is actuated.


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