The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Feb. 10, 2011
Applicants:
Yusun Kim Riley, Weston, MA (US);
Uri Baniel, Buffalo Grove, IL (US);
Peter J. Marsico, Chapel Hill, NC (US);
Inventors:
Yusun Kim Riley, Weston, MA (US);
Uri Baniel, Buffalo Grove, IL (US);
Peter J. Marsico, Chapel Hill, NC (US);
Assignee:
Tekelec, Inc., Morrisville, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/14 (2006.01); H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 12/1403 (2013.01); H04L 12/14 (2013.01); H04L 41/5058 (2013.01); H04L 43/028 (2013.01); H04L 43/18 (2013.01); H04L 65/1016 (2013.01);
Abstract
According to one aspect, the subject matter described herein includes a method for communicating service data flow (SDF) event information. The method includes steps occurring at a policy and charging rules function (PCRF) node. The method also includes communicating, via an Rx interface, a request to a deep packet inspection (DPI) node to be notified when an SDF event occurs. The method further includes receiving notification from the DPI node that the SDF event has occurred.