The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Aug. 28, 2014
Applicant:

Infinera Corp., Annapolis Junction, MD (US);

Inventors:

Kuang-Tsan Wu, Kanata, CA;

John D. McNicol, Ottawa, CA;

David F. Welch, Atherton, CA;

Stephen G. Grubb, Reisterstown, MD (US);

Pierre Mertz, Baltimore, MD (US);

Assignee:

Infinera Corporation, Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/06 (2006.01); H04B 10/516 (2013.01); H04B 10/2575 (2013.01);
U.S. Cl.
CPC ...
H04B 10/516 (2013.01); H04B 10/2575 (2013.01);
Abstract

An apparatus including a photodiode, a low pass filter, an analog-to-digital converter, an interpolation circuit and a digital signal processor is disclosed. The photodiode receives a portion of a plurality of optical signals, each of which is modulated in accordance with a corresponding one of a plurality of data streams, and each having a corresponding one of a plurality of wavelengths. The photodiode supplies an electrical output. The low-pass filter supplies a filtered output in response to the electrical output. The analog-to-digital converter is configured to sample the filtered output at a first sampling rate to generate a plurality of first data samples. The interpolation circuit is configured to receive the plurality of first data samples and supply a plurality of second data samples at a second sampling rate less the first sampling rate. The digital signal processor circuit is configured to receive the plurality of second data samples.


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