The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Sep. 16, 2013
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Yuichi Ariga, Tokyo, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14627 (2013.01); H01L 27/14605 (2013.01);
Abstract
Each microlens exhibits a distortion aberration characteristic in which the ratio of a range where a light beam having passed through the microlens forms an image on a predetermined number of pixels associated with the microlens when the imaging optical system takes the second f-number, to a range where a light beam having passed through the microlens forms an image when the imaging optical system takes the first f-number is higher than the ratio of the first f-number to the second f-number.