The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Jul. 26, 2013
Raytheon Company, Waltham, MA (US);
Andrew M. Kowalevicz, Arlington, VA (US);
Frank Allen Birdsong, Jr., Alexandria, VA (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
A non-retro-reflective imaging system and methods in which tilted image plane imaging is combined with selective Fourier filtering to substantially eliminate retro-reflection from the system. In certain examples, tilted image plane imaging is achieved using sliced source imaging. Through rotation of the image plane, the majority of incident light is reflected off-axis, rather than being retro-reflected. The Fourier filter is used to block incoming light from a particular angle that would otherwise be normally incident on the rotated image plane and retro-reflected. One example of a non-retro-reflective imaging system includes an optical element that focuses electromagnetic radiation onto a tilted image plane, an imaging sensor co-aligned with the tilted image plane, and a Fourier filter positioned in a Fourier plane of the optical element, a position of the Fourier filter in the Fourier plane determined by the tilt angle of the tilted image plane.