The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Oct. 01, 2013
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);

Inventors:

Erik C. Garnett, Amsterdam, NL;

Mark L. Brongersma, Redwood City, CA (US);

Yi Cui, Stanford, CA (US);

Michael D. McGehee, Palo Alto, CA (US);

Mark Greyson Christoforo, Los Altos Hills, CA (US);

Wenshan Cai, Marietta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 3/00 (2006.01); C08J 7/18 (2006.01); H01B 1/00 (2006.01); H01B 13/00 (2006.01); H01B 1/02 (2006.01); B82Y 40/00 (2011.01); H01L 31/0224 (2006.01);
U.S. Cl.
CPC ...
H01B 1/00 (2013.01); H01B 1/02 (2013.01); H01B 13/0016 (2013.01); B82Y 40/00 (2013.01); H01L 31/022466 (2013.01); Y10T 428/24074 (2015.01); Y10T 428/24091 (2015.01);
Abstract

Aspects of the present disclosure are directed to apparatuses and methods involving nanowires having junctions therebetween. As consistent with one or more embodiments, an apparatus includes first and second sets of nanowires, in which the second set overlaps the first set. The apparatus further includes a plurality of nanowire joining recrystallization junctions, each junction including material from a nanowire of the first set that is recrystallized into an overlapping nanowire of the second set.


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