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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9165679 B1

PDFFull Text
Date of Patent:
Oct. 20, 2015

Filed:

Sep. 18, 2013

Post package repairing method, method of preventing multiple activation of spare word lines, and semiconductor memory device including fuse programming circuit

Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jong-min Oh, Seoul, KR;

Yung-young Lee, Seongnam-si, KR;

Hoyoung Song, Hwaseong-si, KR;

Chiwook Kim, Hwaseong-si, KR;

Donghyun Sohn, Hwaseong-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-Si, KR;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Shawki S Ismail

Assistant Examiner:

Muhammad Islam

Int. Cl.
CPC ...
G11C 29/50 (2006.01); G11C 29/04 (2006.01); G11C 29/00 (2006.01); G11C 8/08 (2006.01); G11C 8/14 (2006.01);
U.S. Cl.
CPC ...
G11C 29/04 (2013.01); G11C 29/785 (2013.01); G11C 29/808 (2013.01); G11C 8/08 (2013.01); G11C 8/14 (2013.01); G11C 29/50 (2013.01);
Abstract

Provided is a method of preventing simultaneous activation of redundancy memory line or spare word lines, the method including: programming a fail address of a memory line determined to be defective; reprogramming the fail address if a first spare line for the memory line is determined to be defective; storing additional information with respect to the reprogrammed fail address; and activating a second spare line and inactivating the first spare line, referring to the additional information.

Find Patent Forward Citations

Oh, Jong-min. (2015). Post package repairing method, method of preventing multiple activation of spare word lines, and semiconductor memory device including fuse programming circuit (U.S. Patent No. 9165679). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9165679

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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