The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Aug. 28, 2014
Applicants:

Dong-jun Lee, Yongin-si, KR;

Sungsu Moon, Hwaseong-si, KR;

Jaihyuk Song, Seongnam-si, KR;

Changsub Lee, Osan-si, KR;

Inventors:

Dong-Jun Lee, Yongin-si, KR;

Sungsu Moon, Hwaseong-si, KR;

Jaihyuk Song, Seongnam-si, KR;

Changsub Lee, Osan-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/10 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 16/10 (2013.01); G11C 16/0483 (2013.01); G11C 16/26 (2013.01);
Abstract

Non-volatile memory devices and related methods are provided. The non-volatile memory devices include a memory cell array having a plurality of cell strings, each cell string including: a plurality of memory cells stacked in a direction perpendicular to a substrate, a ground selection transistor between the plurality of memory cells and the substrate, and a string selection transistor between the plurality of memory cells and a bit line; an address decoder coupled to the plurality of memory cells in the plurality of cell strings through word lines, to the string selection transistors in the plurality of cell strings through string selection lines, and to the ground selection transistors in the plurality of cell strings through a ground selection line; a read/write circuit coupled to the string selection transistors in the plurality of cell strings through the bit lines; and control logic configured to adjust a substrate voltage applied to the substrate such that threshold voltages of the ground selection transistors are higher than a predetermined level during read operations for at least one of the plurality of memory cells in the plurality of cell strings.


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