The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Jul. 20, 2012
Applicants:

Jae-hyun Kwon, Hwaseong-si, KR;

Young-hun Sung, Hwaseong-si, KR;

Sung-su Kim, Yongin-si, KR;

Hyun-hwa OH, Hwaseong-si, KR;

Inventors:

Jae-hyun Kwon, Hwaseong-si, KR;

Young-hun Sung, Hwaseong-si, KR;

Sung-su Kim, Yongin-si, KR;

Hyun-hwa Oh, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 5/009 (2013.01); A61B 6/482 (2013.01); G06T 5/50 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20028 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30068 (2013.01);
Abstract

An apparatus for generating a diagnosis image includes a local contrast characteristic calculator configured to calculate local contrast characteristics of radiation image data of a low-energy sub-band from radiation image data generated by radiation having at least two energy bands passing through a subject; a local contrast characteristic applier configured to apply the calculated local contrast characteristics to radiation image data of a full-energy band generated by the radiation having at least two energy bands passing through the subject; and a diagnosis image generator configured to generate a diagnosis image of the subject based on the radiation image data of the full-energy band to which the local contrast characteristics have been applied.


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